@article {559,
	title = {Apparatus and method for analyzing a sample },
	year = {2021},
	publisher = {USPTO},
	address = {United States},
	abstract = {<div class="rtejustify">An apparatus and method for Crystal Anisotropy Terahertz Microscopy ({\textquotedblleft}CATM{\textquotedblright}) is provided. The apparatus includes an emitter configured to emit a THz pulse and a detector configured to detect the THz pulse after the pulse is transmitted through a sample disposed on a sample surface of the detector. A pulsed radiation generator generates a probe beam to interrogate the detector. The detector may include an electro-optical ({\textquotedblleft}EO{\textquotedblright}) crystal configured to change in birefringence according to the THz pulse. The sample surface of the detector may have a dielectric coating which is transmissive to THz and reflective to the probe beam. The sample is disposed on the dielectric coating.</div>
},
	issn = {11,125,685},
	url = {https://patents.google.com/patent/US11125685B2/en},
	author = {Markelz, Andrea G and Acbas, Gheorghe and Niessen, Katherine A.}
}
