01175nas a2200145   4500008004100000022001500041245004900056210004800105260002500153520072700178100002300905700002000928700002700948856005400975       2021                        eng d  a11,125,68500aApparatus and method for analyzing a sample 0 aApparatus and method for analyzing a sample  aUnited StatesbUSPTO3 a<div class="rtejustify">An apparatus and method for Crystal Anisotropy Terahertz Microscopy (“CATM”) is provided. The apparatus includes an emitter configured to emit a THz pulse and a detector configured to detect the THz pulse after the pulse is transmitted through a sample disposed on a sample surface of the detector. A pulsed radiation generator generates a probe beam to interrogate the detector. The detector may include an electro-optical (“EO”) crystal configured to change in birefringence according to the THz pulse. The sample surface of the detector may have a dielectric coating which is transmissive to THz and reflective to the probe beam. The sample is disposed on the dielectric coating.</div>
1 aMarkelz, Andrea, G1 aAcbas, Gheorghe1 aNiessen, Katherine, A.  uhttps://patents.google.com/patent/US11125685B2/en