<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>25</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Markelz, Andrea G</style></author><author><style face="normal" font="default" size="100%">Acbas, Gheorghe</style></author><author><style face="normal" font="default" size="100%">Niessen, Katherine A.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Apparatus and method for analyzing a sample </style></title></titles><dates><year><style  face="normal" font="default" size="100%">2021</style></year></dates><urls><web-urls><url><style face="normal" font="default" size="100%">https://patents.google.com/patent/US11125685B2/en</style></url></web-urls></urls><publisher><style face="normal" font="default" size="100%">USPTO</style></publisher><pub-location><style face="normal" font="default" size="100%">United States</style></pub-location><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">&lt;div class=&quot;rtejustify&quot;&gt;An apparatus and method for Crystal Anisotropy Terahertz Microscopy (“CATM”) is provided. The apparatus includes an emitter configured to emit a THz pulse and a detector configured to detect the THz pulse after the pulse is transmitted through a sample disposed on a sample surface of the detector. A pulsed radiation generator generates a probe beam to interrogate the detector. The detector may include an electro-optical (“EO”) crystal configured to change in birefringence according to the THz pulse. The sample surface of the detector may have a dielectric coating which is transmissive to THz and reflective to the probe beam. The sample is disposed on the dielectric coating.&lt;/div&gt;
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